Zhang Y., Zhang D., Wu J., Sebastian M.A., Huan J., Gautam B., Ogunjimi V., Panth M., Haugan T.*2 Wang H.
Ключевые слова: HTS, YBCO, thin films, nanocomposites, nanorods, interfaces, pinning centers artificial, defects columnar, critical caracteristics, critical current, magnetic field dependence, angular dependence, mechanical properties, strain effects, microstructure, lattice parameter, stacking fault, Jc/B curves, pinning force, experimental results
Wang H., Zhang Y., Haugan T., Wu J.Z., Zhang D., Huang J., Sebastian M.A., Jian J., Gautam B., Ogunjimi V.
Ключевые слова: HTS, YBCO, nanocomposites, films, pinning centers artificial, interfaces, substrate SrTiO3, PLD process, microstructure, critical caracteristics, Jc/B curves, pinning force, critical temperature, X-ray diffraction, angular dependence, critical current density, lattice parameter, stacking fault, nanorods
Ключевые слова: HTS, GdYBCO, coated conductors, fabrication, doping effect, deformation, critical caracteristics, stacking fault, measurement setup, measurement technique, strain effects, temperature dependence, loads, critical current, angular dependence, magnetic field dependence, microstructure, experimental results
Chaud X., Pan A.V., Habisreuther T., Prikhna T.A., Rabier J., Joulain A., Moshchill V.E., Litskendorf D.
Ключевые слова: HTS, YBCO, bulk, melting, texture, microstructure, dislocations, twin boundaries, stacking fault, fabrication, critical caracteristics, Jc/B curves, pinning force, experimental results
Ключевые слова: HTS, YBCO, thin films, nanoscaled effects, nanocomposites, interfaces, nanorods, stacking fault, pinning centers, microstructure, PLD process, substrate SrTiO3, nodoping, X-ray diffraction, critical caracteristics, critical current density, angular dependence, Jc/B curves, temperature dependence
Ключевые слова: HTS, YBCO, films, chemical solution deposition, nanocomposites, nanoscaled effects, flux creep, angular dependence, critical caracteristics, current-voltage characteristics, pinning, vortex dynamics, stacking fault, phase diagram, temperature dependence, magnetic field density, relaxation, experimental results
Ключевые слова: HTS, YBCO, YDyBCO, coated conductors, stacking fault, critical caracteristics, critical current, TFA-MOD process, substrate Ni-W, RABITS process, X-ray diffraction, microstructure, porosity, lattice parameter, oxygenation treatments, phase composition, nanoparticles, angular dependence, pinning, fabrication, experimental results
Ключевые слова: HTS, YBCO, thin films, nanodoping, nanoscaled effects, stacking fault, defects, PLD process, substrate SrTiO3, critical caracteristics, irreversibility fields, microstructure, critical current density, angular dependence, magnetic field dependence, temperature dependence, upper critical fields, Jc/B curves, pinning force
Ключевые слова: MgB2, bulk, defects, dislocations, numerical analysis, stacking fault
Obradors X., Puig T., Coll M., Gazquez J., Palau A., Ricart S., Sanchez C. F., Vlad V.R., Calleja A., Vilardell M., Granados X., Cayado P., Pop C., Soler L., Rouco V., Valles F., Villarejo B., Guzman R., Mundet B., Farjas J., Roura P., Bartolome E., Garzon A., Ros J.
Ключевые слова: presentation, HTS, YBCO, coated conductors, chemical solution deposition, nanocomposites, nanoscaled effects, TFA route, precursors, inkjet printing, nucleation, fabrication, microstructure, buffer layers, IBAD process, critical caracteristics, critical current density, angular dependence, growth rate, pinning, interfaces, pinning force, Jc/B curves, stacking fault
Ключевые слова: presentation, HTS, coated conductors, modeling, numerical analysis, ac losses, stacking fault, homogeneity
Ключевые слова: LTS, Nb3Al, wires, microstructure, pinning centers, stacking fault, pinning force, critical caracteristics, Jc/B curves, grain size
Strickland N.M., Wimbush S.C., Long N.J., Talantsev E.F., Xia J.A., Tallon J.L., Storey J.G., D’Souza P., Ingham B., Knibbe R.
Ключевые слова: MgB2, mechanical properties, elastic behavior, dislocations, stacking fault, pressure dependence, lattice parameter, bulk, modeling, numerical analysis
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